Prof. Andrea Ferrero
 Dip. Elettronica
 Politecnico di Torino
 Duca degli Abruzzi 24
10124, Torino, Italy
Tel:+390115644082
Fax:+390115644099

Nonlinear Microwave Measurements: From Power Meters to Large-Signal Network Analyzers

We cover nonlinear microwave device characterization from the early beginning of power meters to the most advance instruments available today like e.g. the Large-Signal Network Analyzers. The presentation deals with nonlinear characterization techniques for individual power transistors as well as for communication systems: fundamental and harmonic loadpull measurements, spectral regrowth measurements (ACPR,…), intermodulation measurements (IM3, IM5,…), harmonic distortion analysis, error vector magnitude measurements and hot S-parameter techniques. Next to covering the broad topic of nonlinear microwave measurements, the audience will be educated on Large- Signal Network Analyzer (LSNA) instruments that can accurately and completely characterize devices under realistic large signal operating conditions.”

Michael D. Janezic
 Electromagnetic Properties of Materials Project
 National Institute of Standards and Technology
 325 Broadway MS 818.01F
 Boulder, CO 80305
Tel: +1 303 497 3656
Fax: +1 303 497 3970

High-Frequency Measurements of Dielectric Substrate Materials

Material manufacturers are developing new, high-performance substrate materials in order to meet the specifications of new applications that operate over wider and wider frequencies. In order for engineers to select the most appropriate material to incorporate into microwave devices, the electrical properties of the substrate, namely the relative permittivity and loss tangent, must be accurately measured, sometimes as a function of frequency, temperature and even humidity. However, there are hundreds of measurement methods published in the literature and selecting the proper technique can be daunting. In this lecture, we overview both transmission-line and resonant techniques for measuring the relative permittivity and loss tangent of dielectric substrates such as printed-circuit boards, printed-wiring boards and ceramic substrates over the frequency range of 1 to 100 GHz. In the area of transmission-line measurements, we outline how to perform broadband on-wafer material measurements using planar structures such as coplanar waveguides and microstrip transmission lines. Next, we overview three resonant measurement methods: the split-cylinder, split-post and Fabry-Perot resonators. These three measurement techniques are increasingly being used by industry to accurately characterize substrate materials at microwave and millimeter-wave frequencies and represent the state of the art in nondestructive materials testing. The lecture concludes with a discussion of each method's advantages and limitations and with some final remarks about the future direction of high-frequency material measurements.