WSF: ACCURACY OF SYSTEM-LEVEL FIGURES OF MERIT FOR WIRELESS APPLICATIONS  

Date & Time: Sunday, June 12; 8:00 AM to 12:00 PM

Location: Hyatt Regency C

Topics & Speakers:

• System ¨C level figures of merit and measurement accuracy, R. Trott, Aeroflex

• Memory effects and system-level figures of merit: limits on digital pre-distortion, P. Draxler, Principal Engineer/Manager Design Automation and Methodology Group, Qualcomm

• Power - risetime, figures of merit and quality of service, J. Miall and D. Adamson, NPL

• Advantages and limits of error vector usage in performance assessment of wireless systems and apparatuses, L. Angrisani, Università di Napoli Federico II

• Error Vector Magnitude for 802.11a Systems, M. D. McKinley and K. A. Remley, RF Electronics Group, NIST

Organizers:

D. Adamson, NPL

K. Remley, NIST

J. Horton, J.B. Horton Group

Sponsors:

MTT-11: Microwave Measurements 

MTT-16: Microwave Systems 

MTT-20: Wireless Communications  

At IMS 2004 a clear need for improved accuracy in wireless measurements was identified in one of the workshop sessions. This workshop will focus on the key system-level measurands which are used to determine the performance of wireless systems. The objective will be to present and discuss the current state of the art relating to accuracy of these measurands. The workshop will begin with an overview of system-level figures of merit and follow with more detailed presentations on several of the key measurands, presenting work from industry, academia and National Standards Laboratories.