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Nuno Borges Carvalho
Last Updated 04-08-2008

General Measurements Forum

Yahoo! MTT-11 General Measurements Newsgroup: the purpose of this newsgroup is to provide a forum for general microwave measurement discussions. It deals with measurements of the microwave characteristics (e.g. S-parameters) of microwave and lightwave components and with the application of photonic techniques to microwave and mm-wave measurements, moreover it focuses on the metrology and measurement techniques for characterizing the broadband electrical properties of materials.

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Moderators

Stavros Iezekiel. Stavros received the B.Eng. and Ph.D degrees in Electronic and Electrical Engineering from the University of Leeds, where he is now a Senior Lecturer with the Institute of Microwaves and Photonics. His main research area is microwave photonics. He is a Senior Member of the IEEE and received the 1999 IEE Measurement Prize for his contributions to lightwave network analysis. You can contact Stavros directly at s.iezekiel@ieee.org.

Michael Janezic. Michael has been a member of the Electromagnetic Properties of Materials Program at the National Institute of Standards and Technology since 1988. He received his B.S. (1991) and M.S. (1996) degrees in Electrical Engineering at the University of Colorado at Boulder and is currently pursuing a PhD. His current research interests include developing high-frequency methods for measuring the complex permittivity of bulk and thin-film dielectric materials. Michael is a Senior Member of IEEE. You can contact Michael directly at janezic@boulder.nist.gov.

Frequently Asked Questions

Coming soon.

Selected Bibliography

Disclaimer: This is not an exhaustive bibliography. If you would like to suggest a suitable paper to be listed here, please email the moderator.

Lightwave Component Analysis

Design of a 20 GHz lightwave component analyzer P.R. Hernday, G.A. Conrad, M.G. Hart and R.F. Rawson Hewlett-Packard J. Volume 42,  Issue 1, Feb 1991 Page(s):13 - 22

Characterization of high-speed optical components K. Bowe Microwave System News & Communications Technology Volume --,  Issue -, Dec 1987 Page(s):104 - 112

Optical measurements based on RF modulation techniques Vifian, H.; Instrumentation and Measurement, IEEE Transactions on Volume 39,  Issue 6,  Dec 1990 Page(s):982 - 986 Digital Object Identifier 10.1109/19.65811 Summary: A characterization concept is introduced for high-speed lightwave components based on high-frequency RF modulation of the test signals. The concept is explained by using the example of optical transmission measurements covering optical loss, modulati.....

AbstractPlus | Full Text: PDF(508 KB)    IEEE JNL Rights and Permissions

Optical test set for microwave fiber-optic network analysis Curtis, D.D.; Ames, E.E.; Microwave Theory and Techniques, IEEE Transactions on Volume 38,  Issue 5,  May 1990 Page(s):552 - 559 Digital Object Identifier 10.1109/22.54923 Summary: Presented is an optical test set which can be used with any vector network analyzer for measuring microwave transmission and reflection scattering parameters of fiber-optic components. Measurement configurations and operating characteristics are disc.....

AbstractPlus | Full Text: PDF(696 KB)    IEEE JNL Rights and Permissions

Scattering parameter characterization of microwave optoelectronic devices and fiber-optic networks Iezekiel, S.; Snowden, C.M.; Howes, M.J.; Microwave and Guided Wave Letters, IEEE [see also IEEE Microwave and Wireless Components Letters] Volume 1,  Issue 9,  Sept. 1991 Page(s):233 - 235 Digital Object Identifier 10.1109/75.84598 Summary: A microwave fiber-optic network analyzer test set is proposed that will allow the application of two-port calibration theory to the measurement of optical and optoelectronic components in high frequency fiber-optic links. Formulae for the optoelectro.....

AbstractPlus | Full Text: PDF(208 KB)    IEEE JNL Rights and Permissions

Simulation and implementation of lightwave component characterization using a bilateral electro-optic network Elamaran, B.; Pollard, R.D.; Iezekiel, S.; Microwave Theory and Techniques, IEEE Transactions on Volume 45,  Issue 8,  Part 2,  Aug. 1997 Page(s):1493 - 1496 Digital Object Identifier 10.1109/22.618461 Summary: The simulation and implementation of a bilateral electro-optic network has been demonstrated. The advantage of the proposed network is that it can be used as a black box to convert a microwave network analyzer into a two-port lightwave network analyz.....

AbstractPlus | References | Full Text: PDF(84 KB)    IEEE JNL Rights and Permissions

Measurement & calibration procedure for the characterization of the scattering parameters in microwave fiber-optic devices A.H. Quoc and S. Tedjini Proc. 24th European Microwave Conf. (Nice, France) Volume --,  Issue -, 1994 Page(s):934 - 939

Optical-domain implementation of the microwave Txy family of calibration techniques Elamaran, B.; Pollard, R.D.; Iezekiel, S.; Microwave Theory and Techniques, IEEE Transactions on Volume 47,  Issue 7,  Part 2,  July 1999 Page(s):1373 - 1380 Digital Object Identifier 10.1109/22.775481 Summary: The thru-x-y (Txy) family of calibration techniques has been applied to the measurement of the microwave-modulation response of optical components using the most generalized form of available algorithms. An automated bilateral optical test set has be.....

AbstractPlus | References | Full Text: PDF(192 KB)    IEEE JNL Rights and Permissions

Implementation and calibration of a two-port electrooptic network analyzer Elamaran, B.; Pollard, R.D.; Iezekiel, S.; Microwave and Guided Wave Letters, IEEE [see also IEEE Microwave and Wireless Components Letters] Volume 9,  Issue 9,  Sept. 1999 Page(s):369 - 371 Digital Object Identifier 10.1109/75.790477 Summary: A novel bidirectional electrooptic network analyzer has been demonstrated which enables the full S-parameter characterization of both electrooptic (E/O) and optoelectronic (O/E) components using a single connection of the device-under-test to the tes.....

AbstractPlus | References | Full Text: PDF(40 KB)    IEEE JNL Rights and Permissions

A bilateral lightwave network analyzer-architecture and calibration Elamaran, B.; Pollard, R.D.; Iezekiel, S.; Microwave Theory and Techniques, IEEE Transactions on Volume 48,  Issue 12,  Dec. 2000 Page(s):2630 - 2636 Digital Object Identifier 10.1109/22.899023 Summary: The first bilateral lightwave network analyzer (BLNA) architecture that is capable of two-port S-parameter measurements is reported in this paper. A combined two-tier calibration is proposed and implemented for electrooptic and optoelectronic measure.....

AbstractPlus | References | Full Text: PDF(120 KB)    IEEE JNL Rights and Permissions

Recent developments in lightwave network analysis Iezekiel, S.; Elamaran, B.; Pollard, R.D.; Electronics & Communication Engineering Journal Volume 13,  Issue 2,  April 2001 Page(s):85 - 94 Summary: The widespread use of photonic systems having microwave modulation bandwidths, coupled with the inclusion of photonic components in microwave and millimetre-wave systems, is creating a demand for efficient characterisation techniques. In particular, .....

AbstractPlus | Full Text: PDF(1196 KB)    IEE JNL

Photodiode and Modulator Characterisation

GaInAs photodiodes as transfer standards for picosecond measurements Humphreys, D.A.; Moseley, A.J.; Optoelectronics [see also IEE Proceedings-Optoelectronics], IEE Proceedings J Volume 135,  Issue 2,  April 1988 Page(s):146 - 152 Summary: GaInAs photodiodes are developed for use as pulsed transfer standards at the optical fibre communications wavelengths. The concept and requirements for a transfer standard photodiode are discussed. The photodiode and mount are theoretically modelled,.....

AbstractPlus | Full Text: PDF(704 KB)    IEE JNL

Integrated-optic system for high-speed photodetector bandwidth measurements Humphreys, D.A.; Electronics Letters Volume 25,  Issue 23,  9 Nov. 1989 Page(s):1555 - 1557 Summary: A novel measurement system based on an integrated-optic modulator has been used to determine the frequency response of a high-speed GaInAs photodiode. A nominally 8 GHz bandwidth modulator provided a 3 μW levelled, continuously tunable, modulated .....

AbstractPlus | Full Text: PDF(200 KB)    IEE JNL

Novel microwave reflectometer for accurate characterisation of high-speed photodiode optoelectronic response Humphreys, D.A.; Gifford, A.D.; Electronics Letters Volume 28,  Issue 23,  5 Nov. 1992 Page(s):2138 - 2140 Summary: A reflectometer technique which corrects source-mismatch errors using scalar optoelectronic measurements alone is demonstrated. Results corrected using voltage-reflection-coefficient (VRC) measurements of both the photodiode and measurement system ar.....

AbstractPlus | Full Text: PDF(244 KB)    IEE JNL

Calibration of optical modulators by optical down-conversion Watson, C.D.; Humphreys, D.A.; Wilson, M.G.F.; Photonics Technology Letters, IEEE Volume 5,  Issue 9,  Sept. 1993 Page(s):1005 - 1007 Digital Object Identifier 10.1109/68.257173 Summary: A new method for the calibration of intensity modulators and modulated laser diodes at millimeter-wave frequencies is presented. The method uses an integrated-optic modulator as both a mixer and a frequency doubler. To demonstrate the measurement tec.....

AbstractPlus | Full Text: PDF(280 KB)    IEEE JNL Rights and Permissions

Comparison of photodiode frequency response measurements to 40 GHz between NPE and NIST Gifford, A.D.; Humphreys, D.A.; Hale, P.D.; Electronics Letters Volume 31,  Issue 5,  2 March 1995 Page(s):397 - 398 Summary: The authors report the first comparison, at the national standards level, of photodiode frequency response measurements at wavelengths of 1.285, 1.319 and 1.531 μm. A photodiode was measured up to 40 GHz and the results were normalised to 1.319 &m.....

AbstractPlus | Full Text: PDF(180 KB)    IEE JNL

Improved error correction technique for on-wafer lightwave measurements of photodetectors Debie, P.; Martens, L.; Kaiser, D.; Photonics Technology Letters, IEEE Volume 7,  Issue 4,  April 1995 Page(s):418 - 420 Digital Object Identifier 10.1109/68.376821 Summary: An accurate correction technique for on-wafer small-signal lightwave measurements of photodetectors is presented. This technique is an improvement of the conventional calibration methods for on-wafer lightwave measurements. Mathematical expressions f.....

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Measuring the frequency response of gigabit chip photodiodes Hale, P.D.; Clement, T.S.; Williams, D.F.; Balta, E.; Taneja, N.D.; Lightwave Technology, Journal of Volume 19,  Issue 9,  Sept. 2001 Page(s):1333 - 1339 Digital Object Identifier 10.1109/50.948281 Summary: We describe a calibration and measurement procedure for determining the intrinsic frequency response of gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time domain using a cal.....

AbstractPlus | References | Full Text: PDF(93 KB)    IEEE JNL Rights and Permissions

Wideband frequency-response measurement of optical receivers using optical heterodyne detection Kawanishi, S.; Takada, A.; Saruwatari, M.; Lightwave Technology, Journal of Volume 7,  Issue 1,  Jan. 1989 Page(s):92 - 98 Digital Object Identifier 10.1109/50.17738 Summary: Measurements have been carried out using 1.3-μm distributed-feedback laser diodes (DFB-LDs). The frequency difference of the LDs is continuously varied with temperature changes of a few degrees and the spectral linewidth of one of the LDs is narro.....

AbstractPlus | Full Text: PDF(520 KB)    IEEE JNL Rights and Permissions