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Nuno
Borges Carvalho
Last Updated
14-01-2010
On-Wafer S- and Noise-Parameters Measurements
Signal Integrity and Multiport Measurements
Nonlinear and Loadpull Measurements
Errors and Uncertainties for VNA Measurements
Measurement Milestones
Disclaimer: This is not an exhaustive
list.
If you would like to suggest a suitable paper to be listed here, please email the
milestones paper
coordinator.
Topics Covered:
Vector Network Analyzer Measurements
Signal Integrity and Multiport Measurements
Uncertainty in Measurement
General Measurement Uncertainty
Uncertainty Specific to RF and Microwave Measurement
Large-Signal and Nonlinear Measurements
Large-Signal and Nonlinear Measurement Hardware
Nonlinear Measurements and Test Signals
Nonlinear Modeling starting from Large-Signal Measurements
Noise Measurements
On Noise General Measurement Methods
On Noise 50 Ohms Measurement Methods
| An automatic
network analyzer system R.A.Hackborn; Microwave Journal Volume 11, 1968 Page(s):45 - 52 |
| De-Embedding
and Unterminating Bauer, R.F., Jr.; Penfield, P.; Microwave Theory and Techniques, IEEE Transactions on Volume 22, Issue 3, Mar 1974 Page(s):282 - 288 AbstractPlus | Full Text: PDF(680 KB) IEEE JNL |
An
analysis of vector measurement accuracy enhancement techniques |
| An Explicit
Solution for the Scattering Parameters of a Linear Two-Port Measured
with an Imperfect Test Set (Correspondence) Kruppa, W.; Sodomsky, K.F.; Microwave Theory and Techniques, IEEE Transactions on Volume 19, Issue 1, Jan 1971 Page(s):122 - 123 AbstractPlus | Full Text: PDF(264 KB) IEEE JNL |
| On the
Calibration Process of Automatic Network Analyzer Systems (Short Papers) Rehnmark, S.; Microwave Theory and Techniques, IEEE Transactions on Volume 22, Issue 4, Apr 1974 Page(s):457 - 458 AbstractPlus | Full Text: PDF(264 KB) IEEE JNL |
| Closed-Form
Mathematical Solutions to Some Network Analyzer Calibration Equations Kasa, I.; Instrumentation and Measurement, IEEE Transactions on Volume 23, Issue 4, Dec. 1974 Page(s):399 - 402 Digital Object Identifier 10.1109/TIM.1974.4314321 AbstractPlus | Full Text: PDF(1333 KB) IEEE JNL |
| Rigorous
derivation of computer-corrected network-analyser calibration equations Woods, D.; Electronics Letters Volume 11, Issue 17, August 21 1975 Page(s):403 - 405 Digital Object Identifier 10.1049/el:19750311 AbstractPlus | Full Text: PDF(453 KB) IET JNL |
| A general
waveguide circuit theory R.B. Marks and D.F.Williams J. Rsrch. of the Nat. Inst. Of Stds. And Tech. Volume 97, Sept.-Oct 1992 Page(s):533 - 561 |
|
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual
Six-Port Automatic Network Analyzer Engen, G.F.; Hoer, C.A.; Microwave Theory and Techniques, IEEE Transactions on Volume 27, Issue 12, Dec 1979 Page(s):987 - 993 AbstractPlus | Full Text: PDF(736 KB) IEEE JNL |
| A generalized
theory and new calibration procedures for network analyzer
self-calibration Eul, H.-J.; Schiek, B.; Microwave Theory and Techniques, IEEE Transactions on Volume 39, Issue 4, April 1991 Page(s):724 - 731 Digital Object Identifier 10.1109/22.76439 AbstractPlus | Full Text: PDF(620 KB) IEEE JNL |
| Two-port
network analyzer calibration using an unknown `thru' Ferrero, A.; Pisani, U.; Microwave and Guided Wave Letters, IEEE [see also IEEE Microwave and Wireless Components Letters] Volume 2, Issue 12, Dec. 1992 Page(s):505 - 507 Digital Object Identifier 10.1109/75.173410 AbstractPlus | Full Text: PDF(156 KB) IEEE JNL |
| A multiline
method of network analyzer calibration Marks, R.B.; Microwave Theory and Techniques, IEEE Transactions on Volume 39, Issue 7, July 1991 Page(s):1205 - 1215 Digital Object Identifier 10.1109/22.85388 AbstractPlus | Full Text: PDF(784 KB) IEEE JNL |
| LRM and LRRM
Calibrations with Automatic Determination of Load Inductance Davidson, Andrew; Jones, Keith; Strid, Eric; ARFTG Conference Digest-Fall, 36th Volume 18, Nov. 1990 Page(s):57 - 63 Digital Object Identifier 10.1109/ARFTG.1990.323996 AbstractPlus | Full Text: PDF(615 KB) IEEE CNF |
| Characteristic
impedance determination using propagation constant measurement Marks, R.B.; Williams, D.F.; Microwave and Guided Wave Letters, IEEE [see also IEEE Microwave and Wireless Components Letters] Volume 1, Issue 6, June 1991 Page(s):141 - 143 Digital Object Identifier 10.1109/75.91092 AbstractPlus | Full Text: PDF(204 KB) IEEE JNL |
|
Characteristic-impedance measurement error on lossy substrates Williams, D.F.; Arz, U.; Grabinski, H.; Microwave and Wireless Components Letters, IEEE [see also IEEE Microwave and Guided Wave Letters] Volume 11, Issue 7, July 2001 Page(s):299 - 301 Digital Object Identifier 10.1109/7260.933777 AbstractPlus | References | Full Text: PDF(56 KB) IEEE JNL |
Signal Integrity and Multiport Measurements
A Rigorous Technique for
Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network
Analyzer
J.C. Tippet and R.A. Speciale
Microwave Theory and Techniques, IEEE Transactions on
Volume 30, Issue 5, May 1982 Page(s): 661- 666
AbstractPlus | Full Text:
PDF (584 KB)
Multi-port-network analysis by matrix renormalization employing voltage-wave
S-parameters with complex normalization
D. Woods
Proc. Inst. Electr. Eng.
Volume 124, Mar 1977 Page(s): 198- 204
Techniques for Correcting
Scattering Parameter Data of an Imperfectly Terminated Multiport When Measured
with a Two-Port Network Analyzer
J.C. Rautio
Microwave Theory and Techniques, IEEE Transactions on
Volume 31, Issue 5, May 1983 Page(s): 407- 412
AbstractPlus | Full Text:
PDF (624 KB)
| A new
implementation of a multiport automatic network analyzer Ferrero, A.; Pisani, U.; Kerwin, K.J.; Microwave Theory and Techniques, IEEE Transactions on Volume 40, Issue 11, Nov. 1992 Page(s):2078 - 2085 |
|
|
AbstractPlus | Full Text:
PDF(536 KB) IEEE JNL |
| Multiport
vector network analyzer calibration: a general formulation Ferrero, A.; Sampietro, F.; Pisani, U.; Microwave Theory and Techniques, IEEE Transactions on Volume 42, Issue 12, Part 1-2, Dec 1994 Page(s):2455 - 2461 |
|
|
AbstractPlus | Full Text:
PDF(492 KB) IEEE JNL |
| Combined
differential and common-mode scattering parameters: theory and
simulation Bockelman, D.E.; Eisenstadt, W.R.; Microwave Theory and Techniques, IEEE Transactions on Volume 43, Issue 7, Part 1-2, July 1995 Page(s):1530 - 1539 |
|
| AbstractPlus | Full Text: PDF(804 KB) IEEE JNL |
| GSOLT: the
calibration procedure for all multi-port vector network analyzers Heuermann, H.; Microwave Symposium Digest, 2003 IEEE MTT-S International Volume 3, 8-13 June 2003 Page(s):1815 - 1818 vol.3 |
|
| AbstractPlus | Full Text: PDF(323 KB) IEEE CNF |
| Multiport
vector network analyzer measurements Martens, J.; Judge, D.; Bigelow, J.; Microwave Magazine, IEEE Volume 6, Issue 4, Dec 2005 Page(s):72 - 81 |
|
|
AbstractPlus | Full Text:
PDF(1351 KB) IEEE JNL |
General Measurement Uncertainty
| ISO, "Evaluation
of measurement data - Supplement 1 to the "Guide to the expression of
uncertainty in measurement" - Propagation of distributions using a Monte
Carlo method" 1st edition 2008, (available from www.iso.org) |
|
| ISO/IEC Guide
98:1995, "Guide to the expression of uncertainty in measurement" International Organization for Standardization. (Available from www.iso.org/iso/store - currently unavailable.) |
|
| "Guidelines for evaluating and expressing the uncertainty of NIST measurement results" B N Taylor and C E Kuyatt NIST Technical Note 1297, 1994. (Available from http:www.physics.nist.gov/Pubs/guidelines/TN1297/tn1297s.pdf) |
|
| "Expression of the uncertainty of measurement in calibration" European cooperation for Accreditation, publication reference EA-4/02, December 1999. (Available from http://www.european-accreditation.org/n1/doc/EA-4-02.pdf ) |
|
| "The Expression of Uncertainty and Confidence in Measurement" United Kingdom Accreditation Service, M3003, Jan 2007. (Available from http://www.ukas.com/Library/downloads/publications/M3003.pdf ) |
|
Uncertainty Specific to RF and Microwave Measurement
|
||
| "Guidelines on the evaluation of Vector Network Analysers (VNA)" EURAMET/cg-12/v.01 (previously EA-10/12), July 2007. (Available from http://www.euramet.org/) |
|
| "An approach to the treatment of uncertainty in complex S-parameter measurements" N M Ridler and M J Salter, Metrologia, 39(3), pp 295-302, June 2002. (Available from http://www.iop.org/EJ/article/0026-1394/39/3/6/me2306.pdf) |
|
| "A classical method for uncertainty analysis with multidimensional data" R. Willink and B. D. Hall, Metrologia, 2001, 38, 9-15 (Available from www.iop.org ) |
|
| "Re-examination of mismatch uncertainty when measuring microwave power and attenuation" I A Harris and F L Warner, IEE Proceedings, Vol 128 Pt H No 1, February 1981. (Available from www.theiet.org ) |
|
| "On the propagation of uncertainty in complex-valued quantities" B D Hall, Metrologia, 41 (2004) 173-177 (Available from www.iop.org) |
|
Large-Signal and Nonlinear Measurement Hardware
High-frequency periodic time-domain
waveform measurement system
Sipila, M.; Lehtinen, K.; Porra, V.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 36, Issue 10, Oct. 1988 Page(s):1397 - 1405
Measurement of magnitude and phase
of harmonics generated in nonlinear microwave two-ports
Lott, U.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 37, Issue 10, Oct. 1989 Page(s):1506 - 1511
Error-corrected large-signal
waveform measurement system combining network analyzer and sampling oscilloscope
capabilities
Kompa, G.; van Raay, F.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 38, Issue 4, April 1990 Page(s):358 - 365
A Vector Corrected High Power On-Wafer
Measurement System with a Frequency Range for the Higher Harmonics up to 40 GHz
M. Demmler, P. Tasker, and M. Schlechtweg
Proc. 24th European Microwave Conference
Volume 24, 1994 Page(s):1367 - 1372
Calibrated vectorial
nonlinear-network analyzers
Van den Broeck, T.; Verspecht, J.;
Microwave Symposium Digest, 1994., IEEE MTT-S International
23-27 May 1994 Page(s):1069 - 1072 vol.2
Accurate on wafer measurement of
phase and amplitude of the spectral components of incident and scattered voltage
waves at the signal ports of a nonlinear microwave device
Verspecht, J.; Debie, P.; Barel, A.; Martens, L.;
Microwave Symposium Digest, 1995., IEEE MTT-S International
16-20 May 1995 Page(s):1029 - 1032 vol.3
Individual characterization of
broadband sampling oscilloscopes with a nose-to-nose calibration procedure
Verspecht, J.; Rush, K.;
Instrumentation and Measurement, IEEE Transactions on
Volume 43, Issue 2, Apr 1994 Page(s):347 - 354
Analytic sampling-circuit model
Williams, D.F.; Remley, K.A.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 49, Issue 6, Part 1, June 2001 Page(s):1013 – 1019
Mixer-based, vector-corrected, vector signal/network
analyzer offering 300kHz-20GHz bandwidth and traceable phase response
Blockley, P.; Gunyan, D.; Scott, J.B.;
Microwave Symposium Digest, 2005 IEEE MTT-S International
12-17 June 2005, pp. 1497-1500
The sampling oscilloscope as a microwave
instrument
D.F. Williams, P.D. Hale, K.A. Remley,
IEEE Microwave Magazine
Aug. 2007, pp. 59-68.
Nonlinear Measurements and Test Signals
Power-amplifier characterization
using a two-tone measurement technique
Clark, C.J.; Silva, C.P.; Moulthrop, A.A.; Muha, M.S.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 50, Issue 6, June 2002 Page(s):1590 - 1602
Quantifying memory effects in RF
power amplifiers
Ku, H.; McKinley, M.D.; Kenney, J.S.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 50, Issue 12, Dec. 2002 Page(s):2843 – 2849
Measurement of memory effect of
high-power Si LDMOSFET amplifier using two-tone phase evaluation
B. Kim, Y. Yang, J. Cha, Y. Y. Woo, and J. Yi
58th ARFTG Conference Digest,
Volume 58, 2001
Multitone signals with low crest
factor
Boyd, S.;
Circuits and Systems, IEEE Transactions on
Volume 33, Issue 10, Oct 1986 Page(s):1018 - 1022
Comments on 'Multitone Signals with
Low Crest Factor'
Van der Ouderaa, E.; Schoukens, J.; Renneboog, J.;
Circuits and Systems, IEEE Transactions on
Volume 34, Issue 9, Sep 1987 Page(s):1125 - 1127
On the use of multitone techniques
for assessing RF components' intermodulation distortion
Pedro, J.C.; De Carvalho, N.B.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 47, Issue 12, Dec. 1999 Page(s):2393 - 2402
A comprehensive explanation of
distortion sideband asymmetries
Borges de Carvalho, N.; Pedro, J.C.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 50, Issue 9, Sept. 2002 Page(s):2090 – 2101
Effect of baseband impedance on FET intermodulation
Brinkhoff, J.; Parker, A.E.;
Microwave Theory and Techniques, IEEE Transactions on
Volume 51, Issue 3, March 2003 Page(s):1045 – 1051
Nonlinear Modeling starting from Large-Signal Measurements
D. Schreurs, J. Verspecht, S. Vandenberghe, and E.
Vandamme,
Straightforward and accurate nonlinear device model parameter estimation
method based on vectorial large-signal measurements,
IEEE Trans. Microwave Theory Tech.,
vol. 50, pp. 2315–2319, Oct. 2002.
D. Schreurs, J. Wood, N. Tufillaro, L.
Barford, and D. Root,
Construction of behavioural models for microwave devices from
time-domain large-signal measurements to speed-up high-level design simulations,
International Journal of RF and Microwave Computer Aided Engineering,
Vol. 13, No. 1, pp. 54-61, 2003.
D.E. Root, J. Verspecht, D. Sharrit, J. Wood, and A.
Cognata,
Broad-band poly-harmonic distortion (PHD) behavioral models from fast
automated simulations and large-signal vectorial network measurements,
IEEE Trans. Microwave Theory Tech.,
vol. 53, pp. 3656–3664, Nov. 2005.
IRE
standards on methods of measuring noise in linear two ports, 1959
Page(s): 60-68
Digital Object Identifier 10.1109/JRPROC.1960.287380
AbstractPlus | Full Text: PDF (1750 KB)
Available
power gain, noise figure, and noise measure of two-ports and their graphical
representations
Fukui, H.;
Circuits Theory, IEEE Transactions on [legacy, pre -
1988]
Volume 13, Issue 2, Jun 1966 Page(s):137 – 142
AbstractPlus | Full Text: PDF(616 KB)
The
theory of noisy four-poles
Rothe, H.;
Electron Devices, Transactions of the IRE
Professional Group on
Volume 1, Issue 4,
Dec. 1954 Page(s):258 - 259
Digital Object Identifier 10.1109/T-ED.1954.14049
AbstractPlus | Full Text: PDF(91 KB)
An
efficient method for computer aided noise analysis of linear amplifier networks
Hillbrand, H.; Russer, P.;
Circuits and Systems, IEEE Transactions on
Volume 23, Issue 4,
Apr 1976 Page(s):235 – 238
AbstractPlus | Full Text: PDF(512 KB)
Fundamentals
of RF and
microwave
noise
figure
measurement
Agilent Application Note 57-1
http://cp.literature.agilent.com/litweb/pdf/5952-8255E.pdf
Noise
figure
measurement
accuracy
Agilent Application Note 57-2
http://cp.literature.agilent.com/litweb/pdf/5952-3706E.pdf
On Noise General Measurement Methods
The
determination of device noise parameters
Lane, R.Q.;
Proceedings of the IEEE
Volume 57, Issue 8,
Aug. 1969 Page(s):1461 - 1462
AbstractPlus | Full Text: PDF(185 KB)
On-Wafer
measurement of
transistor
noise
parameters at NIST
Randa, J.; Walker, D.K.
Page(s): 551-554
Digital Object Identifier 10.1109/TIM.2007.891145
AbstractPlus
| References
| Full Text: PDF (143 KB)
New
method for noise-Parameter measurement of a mismatched linear two-port using
noise power wave formalism
Pasquet, D.; Bourdel, E.; Quintanel, S.; Ravalet, T.; Houssin, P.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 56, Issue 9,
September 2008 Page(s):2136 - 2142
Digital Object Identifier 10.1109/TMTT.2008.2002235
AbstractPlus | Full Text: PDF(783 KB)
On 50 Ohms Measurement Methods
A
new method for on wafer noise measurement
Dambrine, G.; Happy, H.; Danneville, F.; Cappy, A.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 41, Issue 3,
March 1993 Page(s):375 - 381
Digital Object Identifier 10.1109/22.223734
AbstractPlus | Full Text: PDF(552 KB)
FET
noise-parameter determination using a novel technique based on 50-Ω
noise-figure measurements
Lazaro, A.; Pradell, L.; O'Callaghan, J.M.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 47, Issue 3,
March 1999 Page(s):315 - 324
Digital Object Identifier 10.1109/22.750233
AbstractPlus | References | Full Text: PDF(372 KB)
Noise
modeling and measurement techniques [HEMTs]
Cappy, A.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 36, Issue 1,
Jan. 1988 Page(s):1 - 10
Digital Object Identifier 10.1109/22.3475
AbstractPlus | Full Text: PDF(800 KB)
An
improved computational method for noise parameter measurement
Mitama, M.; Katoh, H.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 27, Issue 6,
Jun 1979 Page(s):612 - 615
AbstractPlus | Full Text: PDF(464 KB)
Accuracy
improvements in two-port noise parameter extraction method
Boudiaf, A.; LaPorte, M.; Dangla, J.; Vernet, G.;
Microwave Symposium Digest, 1992., IEEE MTT-S
International
1-5 June 1992 Page(s):1569 - 1572 vol.3
Digital Object Identifier 10.1109/MWSYM.1992.188316
AbstractPlus | Full Text: PDF(264 KB)
Evaluation
of noise parameter extraction methods
Escotte, L.; Plana, R.; Graffeuil, J.;
Microwave Theory and Techniques, IEEE
Transactions on
Volume 41, Issue 3,
March 1993 Page(s):382 - 387
Digital Object Identifier 10.1109/22.223735
AbstractPlus | Full Text: PDF(492 KB)
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