MTT-11 Microwave Measurements



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Last Updated 04-08-2008

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'General' Measurements 

On-Wafer S- and Noise-Parameters Measurements

Signal Integrity and Multiport Measurements

Nonlinear and Loadpull Measurements

Coaxial VNA Measurements

Errors and Uncertainties for VNA Measurements

 

 

 


Signal Integrity and Multiport Measurements Forum

 

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Yahoo! MTT-11 Signal Integrity Characterization Newsgroup focuses on measurement tools and characterization techniques that address signal integrity issues and multiport probing measurements and calibrations.

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Moderators

Prof. Andrea Ferrero. Andrea, born in 1962, received the Ph.D. in Electronic from Politecnico di Torino, Italy in 1991.In 1991 he joined HP as visiting research during summertime developing a new mm-wave load pull system and an innovative multiport VNA. In 1992 he became Assistant researcher at Dip. di Elettronica of Politecnico di Torino, in 1994 he won the Canadian International Scientific Fellowship and joined University of Montreal for one year working on non-linear multiport VNA. From 1996 he was involved in design and development of Custom Active Load Pull system with PAF and Maury Microwave, in 1997 Andrea won the Italian National Competition to became Associate Professor and since than he hold the Associate Professor Chair on Microwave Measurement Techniques at Politecnico di Torino. He has published over 60 papers on calibration and test set development and you can contact Andrea at ferrero@polito.it.

Uwe Arz received the Dipl.-Ing. degree in electrical engineering in 1994 and the Ph.D. degree (summa cum laude) in 2001, both from the University of Hannover, Hannover, Germany. From 1995 to 2001, he was a Research and Teaching Assistant at the Laboratory of Information Technology, University of Hannover. In 2001 he served as a postdoctoral research associate at the National Institute of Standards and Technology in Boulder, Colorado. In 2002 he then joined the Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig, Germany, where he develops metrology for on-wafer measurements. He has authored and co-authored over 50 technical publications and is the recipient of the first ARFTG Microwave Measurement Student Fellowship Award in 1999 and of the 2003 AHMT Measurement Award presented by the Association of German University Professors for Measurement Science. You can contact Uwe directly at Uwe.Arz@ptb.de.

Ali Boudiaf received a Ph.D. in Electrical Engineering from the University of Paris XI, Orsay, France in 1993. He recently joined Maury Microwave as Solid State Tuner Product Manager where he is in charge of the test system development. He worked at Agilent Technologies as R&D project manager in the Signal Integrity group for two years and worked at ATN-Microwave for three years, where he led the enhancement of the noise parameter measurement systems NP5 and the load-pull measurement systems LP2. From 1994 to 1998, he was an Assistant Professor at the University of Marne-la-Vallee, France. His research works focused on semiconductor device modeling and microwave monolithic circuit design. He is the author of several technical papers and holds two patents. You can contact Ali directly at aboudiaf@maurymw.com.


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Frequently Asked Questions

Coming soon.


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Selected Bibliography

Background

Digital Systems Engineering, W. J. Dally and J. W. Poulton, Cambridge, University Press, 1998.

Circuits Interconnects, and Packaging for VLSI, H. B. Bakoglu, AddisonWesley, 1990.

Capacitance, Inductance and Crosstalk Analysis, Charles Walker, ArtechHouse, 1990.

Transmission Line Design Handbook, Brian Wadell, Artech House, 1991.

Electric Transmission Line Fundamentals, Edwin Anderson, Reston Publishing, 1985.

High Speed Digital Design, Johnson and Graham, Prentice Hall, 1993.

Computer Circuits Electrical Design, Ron Poon, Prentice Hall, 1995.

Transmission Lines in Computer Engineering, Sol Rosenstark, McGraw-Hill, 1994.

Electrical Packaging of High Speed Circuitry, Konsowski and Helland, McGraw-Hill, 1997.

Noise Reduction Techniques in Electronic Systems, Henry Ott, Wiley-Interscience, 1988.