Prof. Andrea Ferrero
 Dip. Elettronica
 Politecnico di Torino
 Duca degli Abruzzi 24
10124, Torino, Italy
Tel:+390115644082
Fax:+390115644099

Nonlinear Microwave Measurements: From Power Meters to Large-Signal Network Analyzers

We cover nonlinear microwave device characterization from the early beginning of power meters to the most advance instruments available today like e.g. the Large-Signal Network Analyzers. The presentation deals with nonlinear characterization techniques for individual power transistors as well as for communication systems: fundamental and harmonic loadpull measurements, spectral regrowth measurements (ACPR,…), intermodulation measurements (IM3, IM5,…), harmonic distortion analysis, error vector magnitude measurements and hot S-parameter techniques. Next to covering the broad topic of nonlinear microwave measurements, the audience will be educated on Large- Signal Network Analyzer (LSNA) instruments that can accurately and completely characterize devices under realistic large signal operating conditions.”

Michael D. Janezic
 Electromagnetic Properties of Materials Project
 National Institute of Standards and Technology
 325 Broadway MS 818.01F
 Boulder, CO 80305
Tel: +1 303 497 3656
Fax: +1 303 497 3970

High-Frequency Measurements of Dielectric Substrate Materials

Material manufacturers are developing new, high-performance substrate materials in order to meet the specifications of new applications that operate over wider and wider frequencies. In order for engineers to select the most appropriate material to incorporate into microwave devices, the electrical properties of the substrate, namely the relative permittivity and loss tangent, must be accurately measured, sometimes as a function of frequency, temperature and even humidity. However, there are hundreds of measurement methods published in the literature and selecting the proper technique can be daunting. In this lecture, we overview both transmission-line and resonant techniques for measuring the relative permittivity and loss tangent of dielectric substrates such as printed-circuit boards, printed-wiring boards and ceramic substrates over the frequency range of 1 to 100 GHz. In the area of transmission-line measurements, we outline how to perform broadband on-wafer material measurements using planar structures such as coplanar waveguides and microstrip transmission lines. Next, we overview three resonant measurement methods: the split-cylinder, split-post and Fabry-Perot resonators. These three measurement techniques are increasingly being used by industry to accurately characterize substrate materials at microwave and millimeter-wave frequencies and represent the state of the art in nondestructive materials testing. The lecture concludes with a discussion of each method's advantages and limitations and with some final remarks about the future direction of high-frequency material measurements.

Dominique Schreurs
 K.U.Leuven
Div. ESAT-TELEMIC
Kasteelpark Arenberg 10
B-3001 Leuven
Belgium
Tel [+32](0)16-321821

Measurements for Modelling

Models aimed for microwave and millimeter wave circuit design are typically based on measurements as opposed to physical simulations. The time needed to acquire the data often takes longer than the model extraction itself. The talk will focus on ways to render the characterization process more efficiently. A distinction is made between measurements for passive components and measurements for active devices and circuits. Issues such as propagation of calibration and de-embedding inaccuracies into model parameter extraction are addressed. By means of various examples, adaptive data collection and excitation design are covered. Finally, the optimal selection of measurements for thorough model validation will be elaborated upon.

Stavros Iezekiel
 Department of Electrical and Computer Engineering
University of Cyprus
75 Kallipoleos Avenue,
P.O. Box 20537
1678 Nicosia,
Cyprus
Tel: + 357 22892190
Fax: + 357 22892260
Office: 111 Green Park

Microwave fiber-optic links: Design and measurement issues

Optical fibre is an excellent transmission medium - it has very low loss and very large bandwidth (especially when compared with microwave transmission media). In addition, it is possible to modulate light at several tens of GHz and then recover that modulation. Hence there has been much interest in the use of optical fibre for the transmission and processing of RF signals.
In the first part of the talk, some of the basic design issues for analogue links will be discussed. In particular, the effect of component-to-component interaction on small-signal, large-signal and noise performance will be considered. It will be seen that it is useful to be able to model and measure the "microwave characteristics" of optoelectronic and optical components. In the second part of the talk, various techniques for the measurement of high-speed lightwave components will be outlined. The emphasis will be on extending microwave network analyser techniques to these devices. Issues associated with polarization effects, optical cavity resonances and nonlinearity will be discussed in some detail..

Nick M. Ridler
 Principal Research Scientist Electromagnetics Team National Physical Laboratory Hampton Road Teddington Middlesex
TW11 0LW United Kingdom
Tel: +44 (0) 20 8943 7116

Topic 1: Evaluating errors and uncertainties in RF & microwave measurements

Abstract: This talk gives an overview of the principles and processes involved in dealing with errors in measurements, particularly at RF and microwave frequencies. The talk shows how the concept of uncertainty can be used to quantify the effects of errors that occur during measurements. The methods used to evaluate and express uncertainty are described and illustrated with some simple practical examples. The purpose of this talk is to enlighten rather than mystify the subject of dealing with error and uncertainty in measurement.

Topic 2: All you need to know about RF and microwave coax connectors but were afraid to ask

Abstract: The humble coaxial connector has been a regular player in the high frequency electronics industry for the past fifty years or more. But it is this apparent familiarity, and apparent simplicity, that often leads to misunderstandings and mistakes with the use of connectors. This talk will give a review of coax connectors with an emphasis on how to get the most from any given connector. The talk begins with an historical overview of the evolution of the coax connector right up to the present day. The dos and don’ts of using connectors will also be addressed and how to select the best connector for a given application. Finally, some tips will be given on how to keep connectors in good health and how to ensure long connector life.