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John Barr has been selected by the IEEE Conferences Committee for a 2-year term as Member-at-Large. He was also appointed by the IEEE BoD as a member of the IEEE Governance Committee and as a member of the IEEE Employee Benefits and Compensation Committee (EBCC).

John Barr received a BSEE from Georgia Institute of Technology in 1971, a MSEE in 1974 from Stanford University and a MS in Engineering Management in 1982, from Stanford. Co-Op at Scientific Atlanta 1967-70. Retired after 37 years from Agilent Technologies / Hewlett-Packard in 2008. He served in various engineering R&D roles, including as the R&D Manager/Director for Agilent’s Wireless Semiconductor Test Solutions. Later served as Agilent’s EEsof Product Marketing Manager for RFIC EDA. He is now retired.

John’s technical activities started with the development and design of RF & Microwave component measurement systems, including design of RF downconvertors, IF detectors and automation of these systems. This work in conventional and six-port network analyzers led to five patents and ten published papers covering vector error correction, time domain conversion and multi-parameter measurement systems. This evolved into a concentration in the development of high throughput manufacturing semiconductor test systems for RFICs and wireless communications ICs.