Andrea Ferrero (S’87–M’92–F’11) was born in 1962, and he received the Laurea and the Ph.D. in electronic at Politecnico di Torino, Italy, in 1987 and 1992, respectively. During the same period he joined Hewlett Packard Microwave Technology Division in Santa Rosa as visiting scientist and started his career in the same Politecnico di Torino as Assistant Professor. In 1988 he worked for Aeritalia (Gruppo Sistemi Avionici) as Microwave Measurement System consultant on EMC problems for Avionics.
In 1994 he won the Canadian National Scientist Fellowship and spent one year at the Ecole Politechnic of Montreal. In 1997 he won the Italian National Contest for Associate Professor Chair becoming Associate Professor of Politecnico di Torino for Microwave Measurements. In 2006 he became Full Professor at the Politecnico di Torino where he taught Electronic Instrumentation and Measurements and Microwave Instrumentation in the Electronic and Telecommunication Engineering course until 2012. From 2013 he joined Agilent Technology (now Keysight) as R&D principal engineer.
Since 1994 he is an IEEE reviewer for Microwave Theory and Technique and Instrumentation and Measurement Societies as well as other international scientific Journals. In 1994 he won the Microwave Best Presentation award at the 1994 MMT-S. Since 2000 Prof. Ferrero became a member of the Technical Committee (MTT11) for microwave measurements of the IEEE MTT Society and member of the TPC 27 of the MTT symposium. In 2006 he became senior member of the IEEE and won the IEEE ARFTG Technology Award for advance in Network Analyzer Calibration and non-linear microwave measurement contributions. He has been an international reviewer for the EC metrology program Distinguished Microwave Lecture for the IEEE MTT Society and from 2011 he is IEEE Fellow.
Prof Ferrero served as reviewer for Italian ministry of education and for several other university in Italy and abroad. Prof. Ferrero worked as consultant on instruments and measurements for the major semiconductor companies and instrumentation makers, like Intel, Infineon, HP, ST Microelectronics, Freescale, Agilent, Anritsu and many others overall the world. His microwave measurements design and calibration techniques have been widely adopted in commercial as well as research test systems.
Andrea Ferrero is the author or coauthor of over 100 papers on microwave technologies and measurements techniques and his current interests are focused on device characterization, calibration techniques and VNA metrology.
Finally he is a competition glider pilot with more than 25 years of activity, 2000 flying hours on different gliders and small airplanes.
With the recent digital systems and circuits outstanding increase in speed and complexity, multiport characterization at microwaves and millimeter waves is experiencing an impressive growth in demand and importance. Today the application of multiport techniques is shifting from typical microwave applications to signal integrity in computer technologies.
The importance of the VNA design as well as the calibration techniques which guarantees the accuracy is a must when low level crosstalk needs to be measured or when differential S-parameters are used.
The talk will present the most modern solutions for multiport measurements at microwave frequencies as well as their advance calibration techniques.
In particular the following topics will be given with the focus on multiport application:
- Single-Ended and Differential S-Parameters Review
- VNA Architectures
- Error Models and Calibration Techniques
- Accuracy of Multiport Measurements
- Interconnection and Fixture Design for Multiport Measurement
- On-Wafer Design of Multiport Standards