Sherif Sayed Ahmed (M’09) received the B.Sc. degree (with honors) in electronics and communication engineering from Cairo University, Cairo, Egypt, in 2004, and the M.Sc. degree in microwave engineering from the Technische Universität München, Munich, Germany, in 2007. From 2007 to 2010, he was a Researcher with the Chair for Microwave Engineering and High-Frequency Technology, University of Erlangen–Nuremberg, Erlangen, Germany, where he conducted his doctoral study in the field of microwave and millimeter-wave imaging technologies in a close collaboration with Rohde & Schwarz GmbH & Co. KG, Munich, Germany.
He is currently with Rohde & Schwarz GmbH & Co. KG, where he is involved with the research and development in the fields related to near-field imaging systems, standoff imaging systems, multistatic radar, advanced signal-processing techniques, terahertz technology, low phase-noise oscillators, and numerical electromagnetics. He has coauthored several conference and journal papers in the topic of microwave imaging systems. Mr. Ahmed was the recipient of the 2007 University Academic Award of the Technische Universität München and the 2009 Innovation Award of Rohde & Schwarz GmbH & Co, KG